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SOLČANSKÝ, M. VANĚK, J.
Originální název
MEASUREMENT OF CARRIER BULK-LIFETIME BY THE HELP OF NEW CHEMICAL PASSIVATION IN TECHNOLOGY OF SILICON SOLAR CELLS
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The main material parameter of silicon, that influences the effectiveness of photovoltaic cells, is the minority carrier bulk lifetime. It may change in the technological process, especially during high temperature operations. Monitoring of the carrier bulk-lifetime is necessary for modifying the whole technological process of production. For the measurement of the minority carrier bulk-lifetime the characterization method MW PCD (Microwave Photoconductance Decay) is used, where the result of measurement is the effective carrier lifetime, dependent on the surface recombination velocity and therefore on the quality of a silicon surface passivation. The main objective of this work is to propose a solution, which would meet a few key parameters. It has to exhibit an immediate start-up of passivation properties, long-time stability, the reproducibility of lifetime measurement and the perfect cleaning of the wafer surface must be possible. Another purpose of this work is to identify the parameters of other quinhydrone solutions with different concetrations as compared with the quinhydrone solution in methanol with a concentration of 0.07 mol/l, marked QM007 (referential solution).
Klíčová slova
Chemical passivation, quinhydrone, iodine, carrier lifetime
Autoři
SOLČANSKÝ, M.; VANĚK, J.
Rok RIV
2011
Vydáno
22. 6. 2011
Nakladatel
VUT Brno
Místo
Brno
ISBN
978-80-214-4303-7
Kniha
Electronic Devices and Systems IMAPS CS International Conference 2011
Strany od
134
Strany do
139
Strany počet
6
BibTex
@inproceedings{BUT72488, author="Marek {Solčanský} and Jiří {Vaněk}", title="MEASUREMENT OF CARRIER BULK-LIFETIME BY THE HELP OF NEW CHEMICAL PASSIVATION IN TECHNOLOGY OF SILICON SOLAR CELLS", booktitle="Electronic Devices and Systems IMAPS CS International Conference 2011", year="2011", pages="134--139", publisher="VUT Brno", address="Brno", isbn="978-80-214-4303-7" }