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BRANČÍK, L.
Originální název
Time and Laplace-domain methods for MTL transient and sensitivity analysis
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
The purpose of this paper is to present the development and comparison of selected time-domain and Laplace-domain methods for the simulation of waves propagating along multiconductor transmission lines (MTLs), both uniform and nonuniform, and sensitivities with respect to distributed and lumped parameters of MTL systems. A methodology is based on discrete, semidiscrete and continuous MTL models formulated and solved both in the time and Laplace domains, latter combined with a numerical inverse Laplace transform (NILT). The research is limited to linear MTLs only and the methods suppose terminating circuits based on their generalized Thévenin equivalents. They can be, however, generalized for more complex systems via more sophisticated boundary conditions treatment. The time-domain methods have further potential to be generalized towards nonlinear MTLs. The methods considered can contribute to solving signal integrity issues in high-speed electronic systems, the Matlab routines developed can serve in education process as well.
Klíčová slova
Multiconductor transmission line, implicit Wendroff formula, state-variable method, time domain, Laplace domain, numerical inverse Laplace transform
Autoři
Rok RIV
2011
Vydáno
12. 8. 2011
Nakladatel
Emerald Group Publishing Limited
Místo
United Kingdom
ISSN
0332-1649
Periodikum
COMPEL The international journal for computation and mathematics in electrical and electronic engineering
Ročník
30
Číslo
4
Stát
Spojené království Velké Británie a Severního Irska
Strany od
1205
Strany do
1223
Strany počet
19
URL
http://www.emeraldinsight.com/journals.htm?issn=0332-1649&volume=30&issue=4
BibTex
@article{BUT72823, author="Lubomír {Brančík}", title="Time and Laplace-domain methods for MTL transient and sensitivity analysis", journal="COMPEL The international journal for computation and mathematics in electrical and electronic engineering", year="2011", volume="30", number="4", pages="1205--1223", issn="0332-1649", url="http://www.emeraldinsight.com/journals.htm?issn=0332-1649&volume=30&issue=4" }