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HÉGR, O. BAŘINKA, R. PORUBA, A.
Originální název
Negatively Charged Al2O3 Layers Deposited by Magnetron Sputtering and Vacuum Evaporation for Crystalline Silicon Solar Cell BSF
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The main goal of our work is utilization of well established vacuum technologies as magnetron sputtering and vacuum evaporation for transfer of the aluminum oxide deposition process from ALD (Atomic layer deposition) technique to the industrial sputtering system with the aim to implement high quality back-surface field (BSF) passivation into a large and effective deposition system in the technology processes of Solartec company. The passivation effect is tested by MW-PCD (Microwave Photoconductance Decay) measuring method with deposition of identical passivation layers on both sides of Czochralski (CZ) p- and n-type substrates.
Klíčová slova
ALD, magnetron sputtering, vacuum evaporation, Back-Side Field, rear side passivation
Autoři
HÉGR, O.; BAŘINKA, R.; PORUBA, A.
Rok RIV
2011
Vydáno
31. 10. 2011
Nakladatel
WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG
Místo
Sylvensteinstr. 2 81369 München Germany
ISBN
3-936338-27-2
Kniha
EU PVSEC Proceedings, 26th European Photovoltaic Solar Energy Conference and Exhibition
Strany od
1783
Strany do
1786
Strany počet
4
BibTex
@inproceedings{BUT74209, author="Ondřej {Hégr} and Radim {Bařinka} and Aleš {Poruba}", title="Negatively Charged Al2O3 Layers Deposited by Magnetron Sputtering and Vacuum Evaporation for Crystalline Silicon Solar Cell BSF", booktitle="EU PVSEC Proceedings, 26th European Photovoltaic Solar Energy Conference and Exhibition", year="2011", pages="1783--1786", publisher="WIP Wirtschaft und Infrastruktur GmbH & Co Planungs KG", address="Sylvensteinstr. 2 81369 München Germany", isbn="3-936338-27-2" }