Detail publikace

Retargetable Multi-level Debugging in HW/SW Codesign

KŘOUSTEK, J. PŘIKRYL, Z. KOLÁŘ, D. HRUŠKA, T.

Originální název

Retargetable Multi-level Debugging in HW/SW Codesign

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

Debugging is a standard part of an embedded system design process. The debugger is used for a target application debugging and for a testing of the designed system. The target application debugging can be performed either on a statement-accurate level (i.e. source-language level debugging) or on an instruction-accurate level (i.e. assembly-language level debugging). The architecture design debugging is done on a cycle-accurate level. Nowadays embedded systems are often parallel-based. Therefore, it is important to allow debugging of systems with more than one application-specific instruction set processors (ASIP). Since the current trend of ASIP design is focused on automatic tool-chain generation, the debugger must be retargetable to arbitrary architecture. In this paper, we present the concept of an automatically generated multi-level retargetable debugger. This debugger can operate on each of the previously mentioned levels and it allows debugging of multiprocessor systems. The experimental results can be found at the end of the paper.

Klíčová slova

debugging; breakpoint; simulation; DWARF; JTAG;  architecture description languages; application-specific instruction set processors

Autoři

KŘOUSTEK, J.; PŘIKRYL, Z.; KOLÁŘ, D.; HRUŠKA, T.

Rok RIV

2011

Vydáno

19. 12. 2011

Nakladatel

Institute of Electrical and Electronics Engineers

Místo

Hammamet

ISBN

978-1-4577-2209-7

Kniha

The 23rd International Conference on Microelectronics (ICM 2011)

Strany od

1

Strany do

6

Strany počet

6

URL

https://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6177413

BibTex

@inproceedings{BUT76308,
  author="Jakub {Křoustek} and Zdeněk {Přikryl} and Dušan {Kolář} and Tomáš {Hruška}",
  title="Retargetable Multi-level Debugging in HW/SW Codesign",
  booktitle="The 23rd International Conference on Microelectronics (ICM 2011)",
  year="2011",
  pages="1--6",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Hammamet",
  doi="10.1109/ICM.2011.6177413",
  isbn="978-1-4577-2209-7",
  url="https://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6177413"
}