Detail publikace

Calculation of sensitivities in two-dimmensional electrical impedance tomography

VALSA, J., DĚDKOVÁ, J., DĚDEK, L.

Originální název

Calculation of sensitivities in two-dimmensional electrical impedance tomography

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Electrical impedance tomography is used to locate non-homogenities in otherwise homogenous media. The volume to be analyzed is accessible only in limited number of external nodes. Some of these nodes can be supplied from external current source while the others carry potentials that reflect the content of the volume. The present paper shows how the potentials vary with position of non-homogenous elements inside and with the chosen application of testing signal. Resultant sensitivities can be used for calculation of gradients in the optimization process.

Klíčová slova

Electrical impedance tomography, sensitivity, finite element method

Autoři

VALSA, J., DĚDKOVÁ, J., DĚDEK, L.

Rok RIV

2003

Vydáno

1. 5. 2003

Nakladatel

Silesian University of Technology

Místo

Gliwice

ISBN

83-85940-25-1

Kniha

26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003

Strany od

43

Strany do

45

Strany počet

3

BibTex

@inproceedings{BUT8442,
  author="Juraj {Valsa} and Jarmila {Dědková} and Libor {Dědek}",
  title="Calculation of sensitivities in two-dimmensional electrical impedance tomography",
  booktitle="26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003",
  year="2003",
  pages="3",
  publisher="Silesian University of Technology",
  address="Gliwice",
  isbn="83-85940-25-1"
}