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Detail publikace
ŠIKULA, J., DOBIS, P.
Originální název
Noise and Non-linearity as Reliability Indicators of Electronic Devices
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
An aplication of noise and non-linearity measurements in analysis, diagnostic and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typicaly feature of these methods. Conceptions of 1/f noise, burst noise or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. The results of noise and non-linearity measurements are shown. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.
Klíčová slova v angličtině
Noise, Non-linearity, Reliability, Electronic Devices
Autoři
Rok RIV
2003
Vydáno
1. 1. 2003
Nakladatel
MIDEM - Society for Microelectronics, Electronic components and Materials
Místo
Slovenia
ISBN
961-91023-1-2
Kniha
MIDEM Cenference 2003 Proceedings
Strany od
3
Strany do
14
Strany počet
12
BibTex
@inproceedings{BUT9082, author="Josef {Šikula} and Pavel {Dobis}", title="Noise and Non-linearity as Reliability Indicators of Electronic Devices", booktitle="MIDEM Cenference 2003 Proceedings", year="2003", pages="12", publisher="MIDEM - Society for Microelectronics, Electronic components and Materials", address="Slovenia", isbn="961-91023-1-2" }