Detail publikace

Noise and Non-linearity as Reliability Indicators of Electronic Devices

ŠIKULA, J., DOBIS, P.

Originální název

Noise and Non-linearity as Reliability Indicators of Electronic Devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

An aplication of noise and non-linearity measurements in analysis, diagnostic and prediction of reliability of electronic devices is discussed. The sensitivity of noise and non-linearity to the device defects and other irregularities is typicaly feature of these methods. Conceptions of 1/f noise, burst noise or RTS noise, thermal noise and third harmonic voltage are described and theirs explanation is done. The results of noise and non-linearity measurements are shown. Possible reliability indicators for conducting film resistors, MOSFETs and quantum dots are presented.

Klíčová slova v angličtině

Noise, Non-linearity, Reliability, Electronic Devices

Autoři

ŠIKULA, J., DOBIS, P.

Rok RIV

2003

Vydáno

1. 1. 2003

Nakladatel

MIDEM - Society for Microelectronics, Electronic components and Materials

Místo

Slovenia

ISBN

961-91023-1-2

Kniha

MIDEM Cenference 2003 Proceedings

Strany od

3

Strany do

14

Strany počet

12

BibTex

@inproceedings{BUT9082,
  author="Josef {Šikula} and Pavel {Dobis}",
  title="Noise and Non-linearity as Reliability Indicators of Electronic Devices",
  booktitle="MIDEM Cenference 2003 Proceedings",
  year="2003",
  pages="12",
  publisher="MIDEM - Society for Microelectronics, Electronic components and Materials",
  address="Slovenia",
  isbn="961-91023-1-2"
}