Detail publikace

Critical role of near-field optics in the characterization of electro-optical devices

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

Originální název

Critical role of near-field optics in the characterization of electro-optical devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

In applications as diverse as waveguide and quantum-dot analysis, the local NSOM technique offers resolution beyond that possible with conventional confocal microscopy. The NSOM data of the active region of the waveguide are presented.

Klíčová slova

near-field, electro-optical devices

Autoři

MAJZNER, J., TOMÁNEK, P., GRMELA, L., BENEŠOVÁ, M.

Rok RIV

2003

Vydáno

1. 1. 2003

Nakladatel

MJ Servis Ltd.

Místo

Brno

ISBN

80-214-2388-8

Kniha

Radioelektronika 2003 Conference proceedings

Číslo edice

1

Strany od

280

Strany do

283

Strany počet

4

BibTex

@inproceedings{BUT9179,
  author="Jiří {Majzner} and Pavel {Tománek} and Lubomír {Grmela} and Markéta {Benešová}",
  title="Critical role of near-field optics in the characterization of electro-optical devices",
  booktitle="Radioelektronika 2003 Conference proceedings",
  year="2003",
  volume="1",
  number="1",
  pages="4",
  publisher="MJ Servis Ltd.",
  address="Brno",
  isbn="80-214-2388-8"
}