Detail publikace

Experience With Allan Variance Method for MEMS Gyroscope Performance Characterization

VÁGNER, M. BENEŠ, P. HAVRÁNEK, Z.

Originální název

Experience With Allan Variance Method for MEMS Gyroscope Performance Characterization

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The noise performance of four low cost and one reference classic gyroscope is estimated using the Allan variance (AV). The purpose is to highlight problems connected with this process and to decide which parameters are the most important if we want to choose the best gyro for a particular application. From the AV theory, basic kinds of noise and their characteristic slopes of the AV curve are known. For example, angle random walk has the slope of -1/2 and is caused by the white noise on the gyro output. However, the output of low cost gyro is usually corrupted by the more or less correlated noise. The level of correlation affects the slope of AV curve, so the better sensor has the slope closer to the theoretical value, thus a simpler model can be used. When collecting data for analysis, it is the most important to suppress temperature variations and vibrations. Attention should be paid to choose proper sampling frequency. Also the resolution and the connection of an acquisition card should be considered.

Klíčová slova

gyroscopes, microelectromechanical devices, noise, performance evaluation, sensitivity analysis

Autoři

VÁGNER, M.; BENEŠ, P.; HAVRÁNEK, Z.

Rok RIV

2012

Vydáno

13. 5. 2012

Nakladatel

IEEE Service Center

Místo

445 Hoes Lane Piscataway, NJ 08855-1331 USA

ISBN

978-1-4577-1771-0

Kniha

2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings

Edice

1

Číslo edice

1

Strany od

1343

Strany do

1347

Strany počet

5

BibTex

@inproceedings{BUT92093,
  author="Martin {Vágner} and Petr {Beneš} and Zdeněk {Havránek}",
  title="Experience With Allan Variance Method for MEMS Gyroscope Performance Characterization",
  booktitle="2012 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2012) Proceedings",
  year="2012",
  series="1",
  number="1",
  pages="1343--1347",
  publisher="IEEE Service Center",
  address="445 Hoes Lane
Piscataway, NJ 08855-1331 USA",
  isbn="978-1-4577-1771-0"
}