Detail publikace

Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

VANĚK, J. DOLENSKÝ, J. CHOBOLA, Z. LUŇÁK, M. PORUBA, A.

Originální název

Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.

Klíčová slova

Low-Frequency Noise, Microplasma Analysis, Solar Cell Characterization

Autoři

VANĚK, J.; DOLENSKÝ, J.; CHOBOLA, Z.; LUŇÁK, M.; PORUBA, A.

Rok RIV

2012

Vydáno

1. 2. 2012

Nakladatel

Hindawi

Místo

Egypt

ISSN

1110-662X

Periodikum

INTERNATIONAL JOURNAL OF PHOTOENERGY

Ročník

2012

Číslo

2012

Stát

Egyptská arabská republika

Strany od

1

Strany do

5

Strany počet

5

URL

http://www.hindawi.com/journals/ijp/2012/324853/

BibTex

@article{BUT94101,
  author="Jiří {Vaněk} and Jan {Dolenský} and Zdeněk {Chobola} and Miroslav {Luňák} and Aleš {Poruba}",
  title="Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization",
  journal="INTERNATIONAL JOURNAL OF PHOTOENERGY",
  year="2012",
  volume="2012",
  number="2012",
  pages="1--5",
  issn="1110-662X",
  url="http://www.hindawi.com/journals/ijp/2012/324853/"
}