Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
STRNADEL, J. SLIMAŘÍK, F.
Originální název
On Distribution and Impact of Fault Effects at Real-Time Kernel and Application Levels
Typ
článek ve sborníku mimo WoS a Scopus
Jazyk
angličtina
Originální abstrakt
Real-time operating systems are often utilized to simplify the design of embedded time/safety-critical applications. However, real-time embedded systems are sensitive to transient and other faults, each of which can lead to various errors at different system levels and can potentially result in the system failure. In the previous papers, a real-time kernel sensitivity to soft-errors was studied and the errors being induced were classified. In this paper, sensitivity to transient, permanent and firmware faults is analyzed on basis of data gathered from series of experiments over the uC/OS-II kernel. During each of the experiments, various dependability techniques (N-version programming, control-flow checking, watchdog tasks and processing of pairs) - and their combinations - were implemented into the kernel and various faults were injected into the kernel in order to study impact of their effects to both response timeliness and behavior correctness of the system.
Klíčová slova
fault, single event, effect, error, distribution, syndrome, fault tolerance, real-time, operating system, watchdog, control flow checking, version programming, pair processing
Autoři
STRNADEL, J.; SLIMAŘÍK, F.
Rok RIV
2012
Vydáno
4. 9. 2012
Nakladatel
IEEE Computer Society
Místo
Pistacaway
ISBN
978-0-7695-4798-5
Kniha
Proceedings of the 15th Euromicro Conference on Digital System Design: Architectures, Methods and Tools
Strany od
272
Strany do
279
Strany počet
8
URL
https://www.fit.vut.cz/research/publication/9943/
BibTex
@inproceedings{BUT96940, author="Josef {Strnadel} and František {Slimařík}", title="On Distribution and Impact of Fault Effects at Real-Time Kernel and Application Levels", booktitle="Proceedings of the 15th Euromicro Conference on Digital System Design: Architectures, Methods and Tools", year="2012", pages="272--279", publisher="IEEE Computer Society", address="Pistacaway", doi="10.1109/DSD.2012.90", isbn="978-0-7695-4798-5", url="https://www.fit.vut.cz/research/publication/9943/" }