Detail publikace

Analysis of luminescence radiation interact by silicon defects

STOJAN, R. VANĚK, J. MALÝ, M. GVRITISHVILI, R. ŠIMONOVÁ, L. FRANTÍK, O.

Originální název

Analysis of luminescence radiation interact by silicon defects

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Luminescence diagnostic methods of solar cells have still significant diagnostic potential. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Polarization spectroscopy of defects in solar cells may be used to better characterization of solar cells. We used the existing electroluminescence technology and extend it about known polarization spectroscopy to yield the polarized luminescence light by defect in solar cells structure (in wavelengths area with peak about 1100 nm).

Klíčová slova

Solar cell, silicon defect, polarization, luminescence.

Autoři

STOJAN, R.; VANĚK, J.; MALÝ, M.; GVRITISHVILI, R.; ŠIMONOVÁ, L.; FRANTÍK, O.

Rok RIV

2013

Vydáno

3. 9. 2013

Nakladatel

VUT v Brně

Místo

Brno

ISBN

978-80-214-4767-7

Kniha

Advanced Batteries, Accumulators and Fuel Cells [ABAF 14th]

Edice

1

Číslo edice

1

Strany od

124

Strany do

126

Strany počet

3

BibTex

@inproceedings{BUT101533,
  author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý} and Roman {Gvritishvili} and Lucie {Šimonová} and Ondřej {Frantík}",
  title="Analysis of luminescence radiation interact by silicon defects",
  booktitle="Advanced Batteries, Accumulators and Fuel Cells [ABAF 14th]",
  year="2013",
  series="1",
  number="1",
  pages="124--126",
  publisher="VUT v Brně",
  address="Brno",
  isbn="978-80-214-4767-7"
}