Detail publikace

Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure

MACKŮ, R. KOKTAVÝ, P. ŠICNER, J. HOLCMAN, V.

Originální název

Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure

Typ

konferenční sborník (ne článek)

Jazyk

angličtina

Originální abstrakt

Presented research is involved in excess electrical currents created when the silicon material contains cracks and fractures. We performed transport characteristics measurements and electrical noise measurement as well as sample visible and deep infra-red imaging. It turns out that mechanical induced defects are followed by specific electric characteristics. We observe crack-related local breakdowns and local overheating. It is also followed by the electrical current fluctuation in the 1/f form. All regions are thermally but also electrically stressed and the irreversible sample degradation originates. It could be pointed out that our detection methods are very sensitive and they could be also used for analyses of different materials.

Klíčová slova

Solar cell, local defects, fractures, electrical noise, light emission.

Autoři

MACKŮ, R.; KOKTAVÝ, P.; ŠICNER, J.; HOLCMAN, V.

Vydáno

1. 7. 2013

Nakladatel

VUTIUM

Místo

Brno

ISBN

978-80-214-4739-4

Strany od

216

Strany do

216

Strany počet

1

BibTex

@proceedings{BUT101573,
  editor="Robert {Macků} and Pavel {Koktavý} and Jiří {Šicner} and Vladimír {Holcman}",
  title="Mechanical Induced Defects and Fractures in the Silicon Solar Cell Structure",
  year="2013",
  pages="216--216",
  publisher="VUTIUM",
  address="Brno",
  isbn="978-80-214-4739-4"
}