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Detail publikace
ŠIK, O. TRČKA, T. GRMELA, L. VONDRA, M.
Originální název
Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors
Anglický název
Typ
článek v časopise - ostatní, Jost
Jazyk
čeština
Originální abstrakt
Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing.
Anglický abstrakt
Analysis electrical properties change of a semiconductor radiation detector, based on Cadmium-Telluride material has been carried out. The detector was exposed to temperature 100 C for time period of 24 hours. Heat stress caused an increase of leakage currents by two orders. New defect energy levels caused difference in detector current transit, typical for the polarization effect. The noise spectral density of the detector after thermal stressing increases with the power of 6.81, which is significantly higher value than 2.70, measured before thermal stressing.
Klíčová slova
CdTe, Noise, Reliability
Klíčová slova v angličtině
CdTe, šum, spolehlivost
Autoři
ŠIK, O.; TRČKA, T.; GRMELA, L.; VONDRA, M.
Rok RIV
2013
Vydáno
10. 1. 2013
Nakladatel
Universal Association of Computer and Electronics Engineers
Místo
113 Barksdale Professional CTR, Newark, New Castle County, DE, United States of America
ISSN
2319-7498
Periodikum
International Journal of Advancements in Electronics and Electrical Engineering
Ročník
3
Číslo
1
Stát
Spojené státy americké
Strany od
60
Strany do
63
Strany počet
4
BibTex
@article{BUT101977, author="Ondřej {Šik} and Tomáš {Trčka} and Lubomír {Grmela} and Marek {Vondra}", title="Effect of High Operating Temperature on Electrcal Quantities of CdTe Radiation Detectors", journal="International Journal of Advancements in Electronics and Electrical Engineering", year="2013", volume="3", number="1", pages="60--63", issn="2319-7498" }