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STOJAN, R. VANĚK, J. MALÝ, M.
Originální název
Progression of Silicon Solar Cells Luminescence Diagnostic Methods
Typ
článek v časopise - ostatní, Jost
Jazyk
angličtina
Originální abstrakt
Diagnostic of silicon solar cells defects is permanently one of most important steps in production of solar cells. Specify of diagnostic methods leads to a better understanding and more detailed analysis of manufactured cells. Luminescence methods of solar cells are fast and some of the most common methods today. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Spectral response of using CCD camera with those methods is in band-gap infrared wave length area. The main idea of this paper is to analyze emitted infrared radiation silicon solar cell under the forward bias by polarization spectroscopy. This analysis opens up for potential next new questions in diagnostics defects silicon solar cells by luminescence methods.
Klíčová slova
Silicon defect, luminescence, defect detection.
Autoři
STOJAN, R.; VANĚK, J.; MALÝ, M.
Rok RIV
2014
Vydáno
1. 1. 2014
Nakladatel
Horizon Research Publishing,USA
Místo
USA
ISSN
2332-3299
Periodikum
Universal Journal of Electrical and Electronic Engineering
Ročník
2
Číslo
1
Stát
Spojené státy americké
Strany od
18
Strany do
22
Strany počet
5
URL
http://www.hrpub.org/journals/jour_info.php?id=49
BibTex
@article{BUT103820, author="Radek {Stojan} and Jiří {Vaněk} and Martin {Malý}", title="Progression of Silicon Solar Cells Luminescence Diagnostic Methods", journal="Universal Journal of Electrical and Electronic Engineering", year="2014", volume="2", number="1", pages="18--22", doi="10.13189/ujeee.2014.020103", issn="2332-3299", url="http://www.hrpub.org/journals/jour_info.php?id=49" }