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ŠICNER, J. ŠKARVADA, P. MACKŮ, R. KOKTAVÝ, P.
Originální název
Study of the Influence of Structural Defects on Properties of Silicon Solar Cells
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Solar cells of common sizes contains many of these defects and it is not easy to determine the influence of particular defects on the characteristics of the whole solar cell. Therefore, in our research we use samples of size of square centimeter at which we can disentangle the influence of the defect. We localize the defect by using a CCD camera, we measure the electrical, thermal and optical properties of the sample and then study it by means an electron microscope, we find the damaged structure and put it to focused ion beam. We expect the change in electrical, thermal and optical properties of the sample.
Klíčová slova
Focused Ion Beam (FIB), Nondestructive Diagnostics, Solar Cell, Structural Defects
Autoři
ŠICNER, J.; ŠKARVADA, P.; MACKŮ, R.; KOKTAVÝ, P.
Rok RIV
2014
Vydáno
1. 1. 2014
Nakladatel
Trans tech publication
Místo
Switzerland
ISSN
1013-9826
Periodikum
Key Engineering Materials (print)
Ročník
592-593
Číslo
1
Stát
Švýcarská konfederace
Strany od
449
Strany do
452
Strany počet
4
BibTex
@article{BUT105398, author="Jiří {Šicner} and Pavel {Škarvada} and Robert {Macků} and Pavel {Koktavý}", title="Study of the Influence of Structural Defects on Properties of Silicon Solar Cells", journal="Key Engineering Materials (print)", year="2014", volume="592-593", number="1", pages="449--452", doi="10.4028/www.scientific.net/KEM.592-593.449", issn="1013-9826" }