Detail publikace

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

IBRAHIM, A., CHOBOLA, Z.

Originální název

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells

Klíčová slova v angličtině

Temperature dependence

Autoři

IBRAHIM, A., CHOBOLA, Z.

Vydáno

15. 10. 2000

Nakladatel

University of Tochnology

Místo

Roma

Strany od

231

Strany do

235

Strany počet

5

BibTex

@inproceedings{BUT10619,
  author="Ali {Ibrahim} and Zdeněk {Chobola}",
  title="Temperature dependence of 1/f noise and transport characteristics as a nondestructive testing of monocrystalline silicon solar cells",
  booktitle="Proceedings of 15th World Conference on Non-Destructive Testing",
  year="2000",
  pages="5",
  publisher="University of Tochnology",
  address="Roma"
}