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FIALA, P., GESCHEIDTOVÁ, E., DREXLER, P.
Originální název
Ultra-short solitary electromagnetic pulses measurement and semiconductor testing
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
In connection with the events of the last few years and with the increased number of terrorist activities, the problem of identification and measurement of electromagnetic weapons or other systems impact occurred. Among these are also microwave sources, which can reach extensive peak power of up to Pmax = 100 MW. Solitary, in some cases several times repeated, impulses lasting from tp Î <1, 60> ns, cause the destruction of semiconductor junctions. These days we can find scarcely no human activity, where semiconductor structures are not used. The problem of security support of the air traffic, transportation, computer nets, banks, national strategic data centers, and other applications crops up. Several types of system protection from the ultra-short electromagnetic pulses present itself, passive and active protection. The analysis of the possible measuring methods, convenient for the identification and measurement of the ultra-short solitary electromagnetic pulses is presented in this paper; some of the methods were chosen and used for practical measurement.
Klíčová slova
Ultra-short electromagnetic puls, high power microwave generator, calorimetric method, magneto-optical effect, multilayer sensor, Vircator, semiconductors.
Autoři
Rok RIV
2004
Vydáno
14. 9. 2004
Nakladatel
VOP 026 Štenberk, s.p.
Místo
Vyškov
Strany od
1
Strany do
80
Strany počet
BibTex
@inproceedings{BUT11439, author="Pavel {Fiala} and Eva {Gescheidtová} and Petr {Drexler}", title="Ultra-short solitary electromagnetic pulses measurement and semiconductor testing", booktitle="Výkonová elektromagnetická pole v paxi a návaznost na EMC", year="2004", volume="1", number="1", pages="80", publisher="VOP 026 Štenberk, s.p.", address="Vyškov" }