Detail publikace

Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

VANĚK, J., BRZOKOUPIL, V., CHOBOLA, Z., ŠIMEČEK, T.

Originální název

Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Transport and noise characteristic of forward biased 2.3 CW GaSb laser diodes were measured in order to evaluate new technology.

Klíčová slova v angličtině

noise spectroscopy, laser diod

Autoři

VANĚK, J., BRZOKOUPIL, V., CHOBOLA, Z., ŠIMEČEK, T.

Vydáno

14. 9. 2004

Nakladatel

Akademické nakladatelství CERM

Místo

Czech Republic, Cigháj

ISBN

80-7204-353-6

Kniha

Research Activities f Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republic

Strany od

184

Strany do

186

Strany počet

3

BibTex

@inproceedings{BUT11726,
  author="Jiří {Vaněk} and Vladimír {Brzokoupil} and Zdeněk {Chobola} and Tomáš {Šimeček}",
  title="Low frequency noise and I-V characteristic as characterization tools for 2.3 microM CW GaSb based LASER diodes",
  booktitle="Research Activities f Physics Departments of Civil Engineering Faculties in the Czech and Slovak Republic",
  year="2004",
  pages="3",
  publisher="Akademické nakladatelství CERM",
  address="Czech Republic, Cigháj",
  isbn="80-7204-353-6"
}