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Detail publikace
ČUPERA, J.
Originální název
Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The characterization of material structure, lattice orientation or deformation structures is commonly performed by transmission electron microscopy. TEM presents some disadvantages like sample preparation, requiring extremly thin samples and reduced observation area. The coupling of electron channelling contrast imaging (ECCI) with EBSD provides an efficient substitute for TEM technique. SEM-ECCI is powerful, rapid and non destructive structural characterisation technique for imaging orientation and defects in bulk crystalline materials. This paper describes electron channelling contrast imaging of simple copper material. This is because of copper is clearly defined materials with well known structure and serves to explain the nature of phenomenon.
Klíčová slova
Channelling contrast imaging; Electron backscatter diffraction; Inverse pole figure map; Low voltage imaging; Lattice orientation
Autoři
Vydáno
3. 6. 2016
Nakladatel
Brno University of Technology
Místo
Brno
ISBN
978-80-214-5358-6
Kniha
MULTI-SCALE DESIGN OF ADVANCED MATERIALS CONFERENCE PROCEEDINGS
Strany od
2
Strany do
12
Strany počet
11
URL
http://imse.fme.vutbr.cz/images/umvi/aktuality/mikulov_2016/sbornik_2016.pdf
BibTex
@inproceedings{BUT130707, author="Jan {Čupera}", title="Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD", booktitle="MULTI-SCALE DESIGN OF ADVANCED MATERIALS CONFERENCE PROCEEDINGS", year="2016", pages="2--12", publisher="Brno University of Technology", address="Brno", isbn="978-80-214-5358-6", url="http://imse.fme.vutbr.cz/images/umvi/aktuality/mikulov_2016/sbornik_2016.pdf" }