Detail publikace

Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD

ČUPERA, J.

Originální název

Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The characterization of material structure, lattice orientation or deformation structures is commonly performed by transmission electron microscopy. TEM presents some disadvantages like sample preparation, requiring extremly thin samples and reduced observation area. The coupling of electron channelling contrast imaging (ECCI) with EBSD provides an efficient substitute for TEM technique. SEM-ECCI is powerful, rapid and non destructive structural characterisation technique for imaging orientation and defects in bulk crystalline materials. This paper describes electron channelling contrast imaging of simple copper material. This is because of copper is clearly defined materials with well known structure and serves to explain the nature of phenomenon.

Klíčová slova

Channelling contrast imaging; Electron backscatter diffraction; Inverse pole figure map; Low voltage imaging; Lattice orientation

Autoři

ČUPERA, J.

Vydáno

3. 6. 2016

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-5358-6

Kniha

MULTI-SCALE DESIGN OF ADVANCED MATERIALS CONFERENCE PROCEEDINGS

Strany od

2

Strany do

12

Strany počet

11

URL

BibTex

@inproceedings{BUT130707,
  author="Jan {Čupera}",
  title="Imaging of lattice orientation and deformations by electron channelling contrast imaging compared with low voltage imaging and EBSD",
  booktitle="MULTI-SCALE DESIGN OF ADVANCED MATERIALS CONFERENCE PROCEEDINGS",
  year="2016",
  pages="2--12",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-5358-6",
  url="http://imse.fme.vutbr.cz/images/umvi/aktuality/mikulov_2016/sbornik_2016.pdf"
}