Detail publikace

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

HOFMAN, J. HÁZE, J. SHARP, R.

Originální název

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

Typ

přednáška

Jazyk

angličtina

Originální abstrakt

This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.

Klíčová slova

AD converter, TID, radiation, dosimetry, test method

Autoři

HOFMAN, J.; HÁZE, J.; SHARP, R.

Vydáno

30. 3. 2017

BibTex

@misc{BUT134650,
  author="Jiří {Hofman} and Jiří {Háze} and Richard {Sharp}",
  title="A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs",
  year="2017",
  note="lecture"
}