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Detail publikace
ŠKVARENINA, Ľ. GAJDOŠ, A. MACKŮ, R. ŠKARVADA, P.
Originální název
Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The aim of this research is to detect and localize microstructural defects by using an electrically excited light emission from a forward/reverse-bias stressed pn-junction in thin-film Cu(In; Ga)Se2 solar cells with metal wrap through architecture. A different origin of the local light emission from intrinsic/extrinsic imperfections in these chalcopyrite-based solar cells can be distinguished by a spectrally-filtered electroluminescence mapping. After a light emission mapping and localization of the defects in a macro scale is performed a micro scale exploration of the solar cell surface by a scanning electron microscope which follows the particular defects obtained by an electroluminescence. In particular, these macroscopic/microscopic examinations are performed independently, then the searching of the corresponding defects in the micro scale is rather difficult due to a diffused light emission obtained from the macro scale localization. Some of the defects accompanied by a highly intense light emission very often lead to a strong local overheating. Therefore, the lock-in infrared thermography is also performed along with an electroluminescence mapping
Klíčová slova
CIGS; chalcopyrite; thin-film; solar cell; microstructural defects; electroluminescence mapping; scanning electron microscope; lock-in infrared thermography
Autoři
ŠKVARENINA, Ľ.; GAJDOŠ, A.; MACKŮ, R.; ŠKARVADA, P.
Vydáno
1. 12. 2017
Nakladatel
SPIE
Místo
Bellingham, Washington 98227-0010 USA
ISBN
9781510617025
Kniha
Photonics, Devices, and Systems VII
ISSN
0277-786X
Periodikum
Proceedings of SPIE
Ročník
10603
Stát
Spojené státy americké
Strany od
1
Strany do
7
Strany počet
URL
http://dx.doi.org/10.1117/12.2286841
BibTex
@inproceedings{BUT138627, author="Ľubomír {Škvarenina} and Adam {Gajdoš} and Robert {Macků} and Pavel {Škarvada}", title="Detection of microstructural defects in chalcopyrite Cu(In,Ga)Se2 solar cells by spectrally-filtered electroluminescence", booktitle="Photonics, Devices, and Systems VII", year="2017", journal="Proceedings of SPIE", volume="10603", pages="1--7", publisher="SPIE", address="Bellingham, Washington 98227-0010 USA", doi="10.1117/12.2286841", isbn="9781510617025", issn="0277-786X", url="http://dx.doi.org/10.1117/12.2286841" }