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DZURENDA, P. RICCI SARA HAJNÝ, J. MALINA, L.
Originální název
Performance Analysis and Comparison of Different Elliptic Curves on Smart Cards
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Elliptic curves are very often used in the cryptographic protocol design due to their memory efficiency and useful features, such as the bilinear pairing support. However, in many cryptographic papers, elliptic curves are used as a black box, without deeper consideration of their mathematical properties and, even more importantly, without considering implementation implications. As a consequence, novel cryptographic schemes are being published without any real chance of implementation on constrained devices due to their lack of support of basic EC operations like point addition or scalar point multiplication. This paper provides the necessary theoretical overview of main forms of elliptic curves, in particular considering their computational and memory complexity. Next, all major platforms of programmable smart cards are evaluated with respect to EC support and the performance of basic arithmetic operations is assessed using benchmarks. Finally, the evaluation of the implementations of ECC schemes, such as ECDH and ECDSA, is presented.
Klíčová slova
Elliptic curves; Efficiency; Smart Card; MultOS; Java Card; Basic Card; Cryptography; Benchmark
Autoři
DZURENDA, P.; RICCI SARA; HAJNÝ, J.; MALINA, L.
Vydáno
28. 8. 2017
ISBN
978-1-5386-2487-6
Kniha
In 2017 the 15th International Conference on Privacy, Security and Trust (PST)
Strany od
1
Strany do
10
Strany počet
URL
https://ieeexplore.ieee.org/document/8476956
BibTex
@inproceedings{BUT139080, author="Petr {Dzurenda} and Sara {Ricci} and Jan {Hajný} and Lukáš {Malina}", title="Performance Analysis and Comparison of Different Elliptic Curves on Smart Cards", booktitle="In 2017 the 15th International Conference on Privacy, Security and Trust (PST)", year="2017", pages="1--10", doi="10.1109/PST.2017.00050", isbn="978-1-5386-2487-6", url="https://ieeexplore.ieee.org/document/8476956" }