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TALU, S. YADAV, R. ŠIK, O. SOBOLA, D. DALLAEV, R. SOLAYMANI, S. MAN, O.
Originální název
How topographical surface parameters are correlated with CdTe monocrystal surface oxidation
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Numerical analysis was applied to three-dimensional (3D) images for a quantitative description of evolution of surface topography of CdTe after oxidation. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Surface texture analysis provides dependence of topography characteristics on oxidation process. The comprehensive description of the surface micromorphology of the CdTe is an important challenge and it is essential for understanding their properties and their potential technological exploitation. The changes in surface topography were evaluated by atomic force microscopy (AFM). This characterization was carried out for the quantitative analysis of specific microstructural characteristics of samples.
Klíčová slova
CdTe monocrystals; Atomic force microscopy; Fractal analysis; Surface oxidation; Surface morphology
Autoři
TALU, S.; YADAV, R.; ŠIK, O.; SOBOLA, D.; DALLAEV, R.; SOLAYMANI, S.; MAN, O.
Vydáno
31. 5. 2018
Nakladatel
Elsevier
ISSN
1369-8001
Periodikum
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
Číslo
85
Stát
Spojené království Velké Británie a Severního Irska
Strany od
15
Strany do
23
Strany počet
9
URL
https://www.sciencedirect.com/science/article/pii/S1369800118303639
BibTex
@article{BUT147823, author="Stefan {Talu} and Ram Pratap {Yadav} and Ondřej {Šik} and Dinara {Sobola} and Rashid {Dallaev} and Shahram {Solaymani} and Ondřej {Man}", title="How topographical surface parameters are correlated with CdTe monocrystal surface oxidation", journal="MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING", year="2018", number="85", pages="15--23", doi="10.1016/j.mssp.2018.05.030", issn="1369-8001", url="https://www.sciencedirect.com/science/article/pii/S1369800118303639" }