Detail publikace

Large area scanning thermal microscopy and infrared imaging system

MARTINEK, J. VALTR, M. GROLICH, P. HORTVÍK, V. DANICK, B. SHAKER, M. KLAPETEK, P.

Originální název

Large area scanning thermal microscopy and infrared imaging system

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This paper describes two calibrated methods to determine the temperature map of micro- and nano- devices.

Klíčová slova

scanning thermal microscopy; large area SPM; finite element method

Autoři

MARTINEK, J.; VALTR, M.; GROLICH, P.; HORTVÍK, V.; DANICK, B.; SHAKER, M.; KLAPETEK, P.

Vydáno

14. 2. 2019

ISSN

1361-6501

Periodikum

Measurement Science and Technology

Číslo

30

Stát

Spojené království Velké Británie a Severního Irska

Strany od

1

Strany do

12

Strany počet

12

URL

https://iopscience.iop.org/article/10.1088/1361-6501/aafa96

BibTex

@article{BUT156323,
  author="Jan {Martinek} and Miroslav {Valtr} and Petr {Grolich} and Václav {Hortvík} and Briand {danick} and Marjan {Shaker} and Petr {Klapetek}",
  title="Large area scanning thermal microscopy and infrared imaging system",
  journal="Measurement Science and Technology",
  year="2019",
  number="30",
  pages="1--12",
  doi="10.1088/1361-6501/aafa96",
  issn="1361-6501",
  url="https://iopscience.iop.org/article/10.1088/1361-6501/aafa96"
}