Detail publikace

Run-Time Reconfigurable Fault Tolerant Architecture for Soft-Core Processor neo430

SZURMAN, K. KOTÁSEK, Z.

Originální název

Run-Time Reconfigurable Fault Tolerant Architecture for Soft-Core Processor neo430

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Reconfigurable fault tolerant (FT) architecture can be implemented into SRAM FPGA by using combination of Partial Dynamic Reconfiguration (PDR) and Triple Modular Redundancy (TMR). SRAM FPGAs are susceptible to Single Event Upsets (SEUs) which are the most common transient faults induced by cosmic radiation. SEU mitigation mechanism is required when SRAM FPGAs are integrated into safety-critical systems. An essential requirement for these systems is often to remain fail-operational and perform implemented functionality after the occurrence of a fault. In our research, we proposed a run-time FT architecture based on coarse-grained TMR with triplicated soft-core processor neo430, PDR for removing all transient SEU faults and the state synchronization allowing smooth state recovery from the inconsistent state when reconfiguration of failed processor instance was finished into the state where all three processors operate synchronously. This paper describes developed FT architecture and fault recovery strategy performing all necessary steps run-time and without additional blocking of the system functionality. The state synchronization for soft-core processor neo430 architecture is described in detail. Moreover, the paper presents developed PDR framework used for validation of proposed fault recovery strategy.

Klíčová slova

fault recovery, partial dynamic reconfiguration, state synchronization, soft-core processor, neo430, SEU, transient fault, SRAM FPGA

Autoři

SZURMAN, K.; KOTÁSEK, Z.

Vydáno

24. 4. 2019

Nakladatel

IEEE Computer Society

Místo

Cluj-Napoca

ISBN

978-1-7281-0073-9

Kniha

22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2019)

Strany od

136

Strany do

140

Strany počet

4

URL

https://www.fit.vut.cz/research/publication/11905/

BibTex

@inproceedings{BUT156849,
  author="Karel {Szurman} and Zdeněk {Kotásek}",
  title="Run-Time Reconfigurable Fault Tolerant Architecture for Soft-Core Processor neo430",
  booktitle="22nd International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2019)",
  year="2019",
  pages="136--140",
  publisher="IEEE Computer Society",
  address="Cluj-Napoca",
  doi="10.1109/DDECS.2019.8724636",
  isbn="978-1-7281-0073-9",
  url="https://www.fit.vut.cz/research/publication/11905/"
}