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PAPEŽ, N.
Originální název
Advanced structural analysis of silicon solar cells
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The study investigates the structural imperfections of photovoltaic cells based on polycrystalline silicon. Experimental characterization focuses in particular on the degradation and defects analysis. Two modern techniques were used – scanning electron microscopy (SEM) with electron beam-induced current (EBIC) and 3D digital optical microscopy. The properties and range of cell defects that can significantly affect its function were characterized with this inspection and failure analysis.
Klíčová slova
SEM, EBIC, optical microscopy, solar cells, defects
Autoři
Vydáno
25. 4. 2019
Místo
Brno
ISBN
978-80-214-5735-5
Kniha
Proceedings of the 25th Conference STUDENT EEICT 2019
Číslo edice
1
Strany od
723
Strany do
727
Strany počet
5
URL
http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf
BibTex
@inproceedings{BUT158022, author="Nikola {Papež}", title="Advanced structural analysis of silicon solar cells", booktitle="Proceedings of the 25th Conference STUDENT EEICT 2019", year="2019", number="1", pages="723--727", address="Brno", isbn="978-80-214-5735-5", url="http://www.feec.vutbr.cz/conf/EEICT/archiv/sborniky/EEICT_2019_sbornik.pdf" }