Detail publikace

Contactless millimeter wave method for quality assessment of large area graphene

Bloos, D. Kunc, J. Kaeswurm, L. Myers-Ward, RL. Daniels, K. DeJarld, M. Nath, A. van Slageren, J. Gaskill, DK. Neugebauer, P.

Originální název

Contactless millimeter wave method for quality assessment of large area graphene

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

We demonstrate that microwave absorption experiments offer a route for efficient measurements of transport properties for fast and accurate quality control of graphene. This conctactless characterization method can be used to quickly evaluate transport properties over large areas without recourse to complex lithographic methods making it suitable as a probe of quality during wafer scale fabrication. In particular, we demonstrate that absorption measurement of transport properties is sensitive to inhomogeneities in sample transport properties. This is in contrast to traditional methods using electrical contacts which tend to overestimate transport properties due to the formation of preferential conducting channels between the electrodes. Here we compare Shubnikov-de Haas oscillations simultaneously detected by microwave absorption and by conventional contact Hall bar measurements in fields up to 15 Ton quasi-free standing, large area (approximate to 25 mm(2)) monolayer graphene. We find that although the evaluated charge carrier densities from both measurements are similar, the mobility differs considerably due to electronic transport inhomogeneity.

Klíčová slova

large area graphene; contactless measurements; Shubnikov de Haas oscillation; magneto-optical studies

Autoři

Bloos, D.; Kunc, J. ; Kaeswurm, L.; Myers-Ward, RL. ; Daniels, K.; DeJarld, M.; Nath, A.; van Slageren, J.; Gaskill, DK.; Neugebauer, P.

Vydáno

1. 7. 2019

ISSN

2053-1583

Periodikum

2D Materials

Ročník

6

Číslo

3

Stát

Spojené království Velké Británie a Severního Irska

Strany od

035028

Strany do

035028

Strany počet

8

URL

https://iopscience.iop.org/article/10.1088/2053-1583/ab1d7e

BibTex

@article{BUT159705,
  author="Bloos, D. and Kunc, J. and Kaeswurm, L. and Myers-Ward, RL. and Daniels, K. and DeJarld, M. and Nath, A. and van Slageren, J. and Gaskill, DK. and Neugebauer, P.",
  title="Contactless millimeter wave method for quality assessment of large area graphene",
  journal="2D Materials",
  year="2019",
  volume="6",
  number="3",
  pages="035028--035028",
  doi="10.1088/2053-1583/ab1d7e",
  issn="2053-1583",
  url="https://iopscience.iop.org/article/10.1088/2053-1583/ab1d7e"
}