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Detail publikace
ČÍKA, P. ČLUPEK, V.
Originální název
Stress Tester and Network Emulator in Apache JMeter
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Cyber-attacks hit us every day and threat to individuals as well as businesses sphere. This paper describes Denial-of-service (DoS) attacks which are the common types of cyber-attacks. A denial-of-service attack floods online systems with traffic to exhaust resources and bandwidth. As a result, the system is unable to fulfil legitimate requests. Attackers can also use multiple compromised devices to launch this attack. This is known as a distributed-denialof-service (DDoS) attack. The paper deals with developing of universal stress tester and network emulator based on open source project Apache JMeter. New modules developed for DoS attacks and network traffic generator into Apache JMeter will be described in this paper. The modules can test a network infrastructure and network parameters. First part of the paper contains a comparison of tools for stress testing and network emulators, description of common (D)DoS attacks and specification of transmission parameters of data networks. Recently common attacks, such HTTP Flood (Hypertext Transfer Protocol), SYN Flood, ICMP Flood (Internet Control Message Protocol), NTP (Network Time Protocol) Flood, UDP (User Datagram Protocol) Flood, DNS Server Flood (Domain Name Server), DNS Amplification, Slowloris, are described in second part of the paper.
Klíčová slova
Denial-of-service (DoS) attacks, stress test
Autoři
ČÍKA, P.; ČLUPEK, V.
Vydáno
17. 6. 2019
ISBN
978-4-88552-316-8
Kniha
Progress in Electromagnetics Research Symposium
ISSN
1559-9450
Periodikum
Progress In Electromagnetics
Stát
Spojené státy americké
Strany od
3722
Strany do
3726
Strany počet
5
URL
https://ieeexplore.ieee.org/document/9017650
BibTex
@inproceedings{BUT159838, author="Petr {Číka} and Vlastimil {Člupek}", title="Stress Tester and Network Emulator in Apache JMeter", booktitle="Progress in Electromagnetics Research Symposium", year="2019", journal="Progress In Electromagnetics", pages="3722--3726", doi="10.1109/PIERS-Spring46901.2019.9017650", isbn="978-4-88552-316-8", issn="1559-9450", url="https://ieeexplore.ieee.org/document/9017650" }