Detail publikace

TEMPORAL DEVELOPMENT OF RELATIVE ABLATION OF PLASTICS IN MINIATURE CIRCUIT BREAKER DURING SWITCHING PROCESS

ŠIMEK, D.

Originální název

TEMPORAL DEVELOPMENT OF RELATIVE ABLATION OF PLASTICS IN MINIATURE CIRCUIT BREAKER DURING SWITCHING PROCESS

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The paper is focused on an ablation of plastic materials in contact with an electric arc inside the electrical apparatus during the switching process. It is possible to obtain temporal development using method based on optical emission spectroscopy. The emission spectra were taken during the switching process. The hydrogen alpha spectral line of Balmer series was used as an indicator for evaluating of plastics ablation. Complications connected with the measurements are discussed. The main part of the paper deals with a temporal development of relative concentration of a hydrogen in plasma inside the miniature circuit breaker. Atomic spectral lines database of National Institute of Standards and Technology was used as a spectral data source for evaluation.

Klíčová slova

optical emission spectroscopy, plasma, miniature circuit breaker, electric arc

Autoři

ŠIMEK, D.

Vydáno

25. 6. 2020

Nakladatel

Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních

Místo

Brno

ISBN

978-80-214-5867-3

Kniha

Proceedings I of the 26th Conference STUDENT EEICT 2020

Číslo edice

první

Strany od

398

Strany do

402

Strany počet

5

URL

https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_1.pdf

BibTex

@inproceedings{BUT164338,
  author="David {Šimek}",
  title="TEMPORAL DEVELOPMENT OF RELATIVE ABLATION OF PLASTICS IN MINIATURE CIRCUIT BREAKER DURING SWITCHING PROCESS",
  booktitle="Proceedings I of the 26th Conference STUDENT EEICT 2020",
  year="2020",
  number="první",
  pages="398--402",
  publisher="Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních",
  address="Brno",
  isbn="978-80-214-5867-3",
  url="https://www.fekt.vut.cz/conf/EEICT/archiv/sborniky/EEICT_2020_sbornik_1.pdf"
}