Detail publikace

Optimized Impedance Measurement with AD5933

EHLICH, J. ZHIVKOV, I. YORDANOV, R. SALYK, O. WEITER, M.

Originální název

Optimized Impedance Measurement with AD5933

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The publication describes a new method of better impedance measuremnt with AD5933 chip with custom analog frontend.

Klíčová slova

Impedance, AD5933, analog frontend

Autoři

EHLICH, J.; ZHIVKOV, I.; YORDANOV, R.; SALYK, O.; WEITER, M.

Vydáno

14. 5. 2020

Nakladatel

International Spring Seminar on Electronics Technology

Místo

Slovakia

ISBN

9781728167732

Kniha

Proceedings of the International Spring Seminar on Electronics Technology

Edice

May 2020

Strany od

1

Strany do

6

Strany počet

6

URL

https://ieeexplore.ieee.org/document/9121159

BibTex

@inproceedings{BUT164754,
  author="EHLICH, J. and ZHIVKOV, I. and YORDANOV, R. and SALYK, O. and WEITER, M.",
  title="Optimized Impedance Measurement with AD5933",
  booktitle="Proceedings of the International Spring Seminar on Electronics Technology",
  year="2020",
  series="May 2020",
  pages="1--6",
  publisher="International Spring Seminar on Electronics Technology",
  address="Slovakia",
  doi="10.1109/ISSE49702.2020.9121159",
  isbn="9781728167732",
  url="https://ieeexplore.ieee.org/document/9121159"
}