Detail publikace

Zero cross analysis of RTS noise

PAVELKA, J., TACANO, M., TOITA, M., ŠIKULA, J., MUSHA, T.

Originální název

Zero cross analysis of RTS noise

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

RTS noise of Si MOSFETs and GaN HFET was analysed by means of zero cross method. Noise spectral density of crossing events in 1ms to 100s windows was flat over 10mHz to 1kHz frequency without apparent 1/f noise.

Klíčová slova v angličtině

RTS noise, MOSFET, zero cross

Autoři

PAVELKA, J., TACANO, M., TOITA, M., ŠIKULA, J., MUSHA, T.

Rok RIV

2005

Vydáno

1. 1. 2005

Nakladatel

University of Salamanca

Místo

Salamanca, Španělsko

ISBN

0-7354-0267-1

Kniha

Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780

Strany od

217

Strany do

220

Strany počet

4

BibTex

@inproceedings{BUT16489,
  author="Jan {Pavelka} and Munecazu {Tacano} and Masato {Toita} and Josef {Šikula} and Toshimitsu {Musha}",
  title="Zero cross analysis of RTS noise",
  booktitle="Noise and Fluctuations, 18th International Conference on Noise and Fluctuations - ICNF 2005, AIP Conference Proceedings 780",
  year="2005",
  pages="4",
  publisher="University of Salamanca",
  address="Salamanca, Španělsko",
  isbn="0-7354-0267-1"
}