Detail publikace

Noise and non-linearity in passive components as reliability indicators

PAVELKA, J., TACANO, M., ŠIKULA, J.

Originální název

Noise and non-linearity in passive components as reliability indicators

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The noise spectroscopy and non-linearity measurement of thick film resistors and tantalum and niobium capacitors is proposed as a non-destructive testing tool for quality and reliability prediction. The correlation between long-term stability and current noise and third harmonic index of thick film resistors prepared using two different technologies was investigated. The charge carrier transport and noise analysis of Ta2O5 and Nb2O5 dielectric layer capacitors was performed to find correlation between leakage current and noise based quality indicators and optimize aging procedure

Klíčová slova v angličtině

1/f noise, tantalum capacitor, Ta2O5, thick film resistor, reliability

Autoři

PAVELKA, J., TACANO, M., ŠIKULA, J.

Vydáno

1. 1. 2002

Nakladatel

Tohoku University

Místo

Sendai, Japonsko

Strany od

5

Strany do

6

Strany počet

2

BibTex

@inproceedings{BUT16520,
  author="Jan {Pavelka} and Munecazu {Tacano} and Josef {Šikula}",
  title="Noise and non-linearity in passive components as reliability indicators",
  booktitle="Proceedings of 17th ASATEF",
  year="2002",
  pages="2",
  publisher="Tohoku University",
  address="Sendai, Japonsko"
}