Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
LÁČÍK, J. KOUDELKA, V. KUŘÁTKO, D. RAIDA, Z. WÓJCIK, D. MIKULÁŠEK, T. VANĚK, J. JIŘÍČEK, S. VEJMOLA, Č.
Originální název
Rat Head Phantom for Testing of Electroencephalogram Source Localization Techniques
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
In this paper we report a new rat head phantom developed for testing electroencephalogram source localization techniques. The phantom is composed of an agar based mixture mimicking the rat brain, six dipoles and fourteen electrodes for modeling and monitoring of neural activity of the brain, respectively, and a 3D printed skull based on a computed tomography scan of a rat skull. In order to fabricate the phantom with currently available conventional techniques, the phantom is 1.8 times enlarged. To allow scaling, we performed an extensive study of electric properties of the agar based mixture, including electric conductivity, permittivity, and applied voltage, to ensure a linear operating regime. The new phantom facilitates testing of existing and the development of new cortical electrode implants as well as studying the quality of various source localization techniques.
Klíčová slova
Rat head phantom, electroencephalogram source localization, complex permittivity measurement, agar, 3D printing
Autoři
LÁČÍK, J.; KOUDELKA, V.; KUŘÁTKO, D.; RAIDA, Z.; WÓJCIK, D.; MIKULÁŠEK, T.; VANĚK, J.; JIŘÍČEK, S.; VEJMOLA, Č.
Vydáno
8. 6. 2020
Nakladatel
IEEE
Místo
USA
ISSN
2169-3536
Periodikum
IEEE Access
Ročník
8
Číslo
1
Stát
Spojené státy americké
Strany od
106735
Strany do
106745
Strany počet
11
URL
https://ieeexplore.ieee.org/document/9110553
Plný text v Digitální knihovně
http://hdl.handle.net/11012/196554
BibTex
@article{BUT165761, author="Jaroslav {Láčík} and Vlastimil {Koudelka} and David {Kuřátko} and Zbyněk {Raida} and Daniel Krzysztof {Wójcik} and Tomáš {Mikulášek} and Jiří {Vaněk} and Stanislav {Jiříček} and Čestmír {Vejmola}", title="Rat Head Phantom for Testing of Electroencephalogram Source Localization Techniques", journal="IEEE Access", year="2020", volume="8", number="1", pages="106735--106745", doi="10.1109/ACCESS.2020.3000581", issn="2169-3536", url="https://ieeexplore.ieee.org/document/9110553" }