Detail publikace

Testing of Python Models of Parallelized Genetic Algorithms

ŠKORPIL, V. OUJEZSKÝ, V. TULEJA, M.

Originální název

Testing of Python Models of Parallelized Genetic Algorithms

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper describes the testing of three models (master slave, fine-grained, and coarse grained) of parallelized genetic algorithms and the comparison of their computational time with each other and with the basic serial model. The analysis of the number of iterations, the load of the main memory and the central processing unit is the subject of other contributions. Corresponding Python modules have been implemented for these models. A test scenario and a test environment were prepared. Testing was realized on a Linux server with the Ubuntu operating system. A RabbitMQ server creating processes by the SCOOP module on the selected workstation was used. Models have been tested by a single-workstation and multi-workstation scenarios. The tested models bring time savings and efficiency improvement compared to the serial model; the fastest was the fine-grained model.

Klíčová slova

coarse-grained; fine-grained; master-slave; model; parallelized genetic algorithm; Python; Ubuntu

Autoři

ŠKORPIL, V.; OUJEZSKÝ, V.; TULEJA, M.

Vydáno

7. 7. 2020

Nakladatel

IEEE

Místo

Milan, Italy

ISBN

978-1-7281-6376-5

Kniha

Proceedings of the 43 rd International Conference on Telecommunications and Signal Processing

Strany od

235

Strany do

238

Strany počet

4

URL

https://ieeexplore.ieee.org/document/9163475

BibTex

@inproceedings{BUT167257,
  author="Vladislav {Škorpil} and Václav {Oujezský} and Martin {Tuleja}",
  title="Testing of Python Models of Parallelized Genetic Algorithms",
  booktitle="Proceedings of the 43 rd International Conference on Telecommunications and Signal Processing",
  year="2020",
  pages="235--238",
  publisher="IEEE",
  address="Milan, Italy",
  doi="10.1109/TSP49548.2020.9163475",
  isbn="978-1-7281-6376-5",
  url="https://ieeexplore.ieee.org/document/9163475"
}