Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
PÁNEK, R. LOJDA, J. PODIVÍNSKÝ, J. KOTÁSEK, Z.
Originální název
Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper deals with a reliability analysis of a reconfiguration controller which can be a component of a fault-tolerant control system. This controller is designed for an FPGA to be capable of using partial dynamic reconfiguration of the FPGA to mitigate potential faults in the FPGAs configuration memory. These faults, which are called SEUs, can be induced by radiation effects. Therefore, fault tolerance measurement or estimation is very important for designing circuits for critical environments. Thus, the reliability of the reconfiguration controller itself is significant; therefore the Fault Tolerance ESTimation (FT-EST) framework is used for reliability evaluation, which is procured by the discovery of a number of critical configuration bits. Two approaches are used and compared: evaluations of used LUT only, and evaluations of all configuration bits. We ascertained a 20x reduction in time consumption at the expense of a proportional decrease in the amount of critical configuration bits discovered. The obtained results are nearly equivalent.
Klíčová slova
Fault-Tolerant, Partial Dynamic Reconfiguration Controller, Fault Tolerance Property Estimation, FT-EST
Autoři
PÁNEK, R.; LOJDA, J.; PODIVÍNSKÝ, J.; KOTÁSEK, Z.
Vydáno
14. 8. 2020
Nakladatel
IEEE Computer Society
Místo
Hsinchu
ISBN
978-1-7281-6083-2
Kniha
2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers
Strany od
121
Strany do
124
Strany počet
4
URL
https://www.fit.vut.cz/research/publication/12101/
BibTex
@inproceedings{BUT168116, author="Richard {Pánek} and Jakub {Lojda} and Jakub {Podivínský} and Zdeněk {Kotásek}", title="Reliability Analysis of Reconfiguration Controller for FPGA-Based Fault Tolerant Systems: Case Study", booktitle="2020 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) : proceedings of technical papers", year="2020", pages="121--124", publisher="IEEE Computer Society", address="Hsinchu", doi="10.1109/VLSI-DAT49148.2020.9196269", isbn="978-1-7281-6083-2", url="https://www.fit.vut.cz/research/publication/12101/" }