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RAMAZANOV, S. ŢĂLU, Ş. DALLAEV, R. RAMAZANOV, G. ŠKARVADA, P. OULEHLA, J. SOBOLA, D. NAZAROV, D.
Originální název
Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
In this study a comparison of the topography of BiFeO3 (BFO) thin films deposited on tantalum pentoxide substrates of different thicknesses is provided. The Ta2O5 substrates had a roughness increasing with the film thickness. The relationship between substrates of different topography but the same composition with the quality of the growing bismuth ferrite film is estimated. For the first time the topography estimation of BFO on Ta2O5 is presented. The difference in temperature expansion coefficients leads to intensive evaporation of bismuth ferrite from the surface during annealing. XPS analysis is provided for asdeposited and annealed BFO layers.
Klíčová slova
bismuth ferrite, tantalum pentoxide, spectroscopy
Autoři
RAMAZANOV, S.; ŢĂLU, Ş.; DALLAEV, R.; RAMAZANOV, G.; ŠKARVADA, P.; OULEHLA, J.; SOBOLA, D.; NAZAROV, D.
Vydáno
26. 7. 2021
Nakladatel
EDP Sciences
ISSN
2267-1242
Periodikum
E3S Web of Conferences
Ročník
295
Číslo
1
Stát
Francouzská republika
Strany od
Strany do
7
Strany počet
URL
https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html
Plný text v Digitální knihovně
http://hdl.handle.net/11012/203039
BibTex
@inproceedings{BUT172164, author="Shikhgasan {Ramazanov} and Ştefan {Ţălu} and Rashid {Dallaev} and Gusejn {Ramazanov} and Pavel {Škarvada} and Jindřich {Oulehla} and Dinara {Sobola} and Dmitry {Nazarov}", title="Surface morphology and X-ray photoelectron spectroscopy of BiFeO3 thin films deposited on top of Ta2O5/Si layers", booktitle="International Scientific Forum on Sustainable Development and Innovation (WFSDI 2021)", year="2021", journal="E3S Web of Conferences", volume="295", number="1", pages="1--7", publisher="EDP Sciences", doi="10.1051/e3sconf/202129504009", issn="2267-1242", url="https://www.e3s-conferences.org/articles/e3sconf/abs/2021/71/e3sconf_wfsdi2021_04009/e3sconf_wfsdi2021_04009.html" }