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OHLÍDAL, I., FRANTA, D., ČUDEK, V., BURŠÍKOVÁ, V., KLAPETEK, P., JÁKL, M.
Originální název
Optical measurement of mechanical stresses in diamond-like carbon films
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
In this paper the mechanical stresses taking place in diamond thin films prepared by the plasma enhanced chemical vapor deposition onto silicon single crystal substrates are studied. For determination of the stress values the Stoneys formula is used. The values of the film thickness are determined using the combined method of variable angle spectroscopic ellipsometry and near-normal spectroscopic reflectometry. The values of the curvature radii of the deformed silicon substrates in consequence of the film stresses are evaluated using interferometric method based on two-beam interferometry and chromatic aberration method. The dependence of the mechanical stress inside these films on their thickness values is determined. It is found that this dependence can be approximate by the straigth line. The results achieved for the mechanical stresses obtainedby both the optical methods, i.e. by the interferometric and chromatic aberration method, are compared. It is shown that within the experimental accuracy the stress values determined using using both these methods are identical.
Klíčová slova
DLC films, mechanical stress, two-beam interferometry, chromatic aberration method
Autoři
Rok RIV
2005
Vydáno
14. 2. 2005
Nakladatel
Society of Photo-Optical Instrumentation Engineers (SPIE)
Místo
Bellingham, Washington
ISBN
0-8194-5757-4
Kniha
PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)
ISSN
0277-786X
Periodikum
Proceedings of SPIE
Ročník
5776
Číslo
2
Stát
Spojené státy americké
Strany od
717
Strany do
728
Strany počet
12
BibTex
@inproceedings{BUT17226, author="Ivan {Ohlídal} and Daniel {Franta} and Miloslav {Ohlídal} and Vladimír {Čudek} and Petr {Klapetek} and Vilma {Buršíková} and Miloš {Jákl}", title="Optical measurement of mechanical stresses in diamond-like carbon films", booktitle="PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE)", year="2005", journal="Proceedings of SPIE", volume="5776", number="2", pages="717--728", publisher="Society of Photo-Optical Instrumentation Engineers (SPIE)", address="Bellingham, Washington", isbn="0-8194-5757-4", issn="0277-786X" }