Detail publikace

Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy

MISIUREV, D.

Originální název

Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.

Klíčová slova

AFM, SNOM, electrochromic materials, thin–films.

Autoři

MISIUREV, D.

Vydáno

26. 4. 2022

Nakladatel

Brno University of Technology, Faculty of Electrical Engineering and Communication

Místo

Brno

ISBN

978-80-214-6029-4

Kniha

Proceedings I of the 28th Conference STUDENT EEICT 2022 General Papers

Edice

1

Strany od

409

Strany do

414

Strany počet

6

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf

BibTex

@inproceedings{BUT178768,
  author="Denis {Misiurev}",
  title="Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy",
  booktitle="Proceedings I of the 28th Conference STUDENT EEICT 2022 General Papers",
  year="2022",
  series="1",
  pages="409--414",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and Communication",
  address="Brno",
  isbn="978-80-214-6029-4",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf"
}