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Detail publikace
Krizek, F. Reimers, S. Kaspar, Z. Marmodoro, A. Michalicka, J. Man, O. Edstrom, A. Amin, OJ. Edmonds, KW. Campion, RP. Maccherozzi, F. Dhesi, SS. Zubac, J. Kriegner, D. Carbone, D. Zelezny, J. Vyborny, K. Olejnik, K. Novak, V. Rusz, J. Idrobo, JC. Wadley, P. Jungwirth, T.
Originální název
Atomically sharp domain walls in an antiferromagnet
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
The interest in understanding scaling limits of magnetic textures such as domain walls spans the entire field of magnetism from its physical fundamentals to applications in information technologies. Here, we explore antifer-romagnetic CuMnAs in which imaging by x-ray photoemission reveals the presence of magnetic textures down to nanoscale, reaching the detection limit of this established microscopy in antiferromagnets. We achieve atomic resolution by using differential phase-contrast imaging within aberration-corrected scanning transmission electron microscopy. We identify abrupt domain walls in the antiferromagnetic film corresponding to the Neel order reversal between two neighboring atomic planes. Our work stimulates research of magnetic textures at the ultimate atomic scale and sheds light on electrical and ultrafast optical antiferromagnetic devices with magnetic field-insensitive neuromorphic functionalities.
Klíčová slova
DIFFERENTIAL PHASE-CONTRAST; ELECTRIC-FIELDS; METALS; MEMORY
Autoři
Krizek, F.; Reimers, S.; Kaspar, Z.; Marmodoro, A.; Michalicka, J.; Man, O.; Edstrom, A.; Amin, OJ.; Edmonds, KW.; Campion, RP.; Maccherozzi, F. ; Dhesi, SS.; Zubac, J.; Kriegner, D.; Carbone, D.; Zelezny, J. ; Vyborny, K.; Olejnik, K.; Novak, V.; Rusz, J.; Idrobo, JC.; Wadley, P.; Jungwirth, T.
Vydáno
1. 4. 2022
Nakladatel
AMER ASSOC ADVANCEMENT SCIENCE
Místo
WASHINGTON
ISSN
2375-2548
Periodikum
Science Advances
Ročník
8
Číslo
13
Stát
Spojené státy americké
Strany od
eabn3535-1
Strany do
abn3535-10
Strany počet
10
URL
https://www.science.org/doi/10.1126/sciadv.abn3535