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WANG, Z. ZHANG, Y. LIOGAS, K. CHEN, J. VUGHAN, G. KOCICH, R. KUNČICKÁ, L. UZUN, F YOU, Z KORSUNSKY, A
Originální název
In situ synchrotron X-ray diffraction analysis of two-way shape memory effect in Nitinol
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Despite the fact that the Two-Way Shape Memory Effect (TWSME) has been demonstrated in most Shape Memory Alloys, the effective application of this unique functional behaviour is hindered by the lack of a proper training methodology and understanding of its mechanisms. In this study, a novel training routine has been established together with a home-designed device, enabling TWSME of customised spline curvature to be produced. An in situ high energy synchrotron X-ray diffraction experiment has been performed on Nitinol, followed by comprehensive analysis to reveal the micromechanics of TWSME. Multiple mainstream hypotheses have been examined. The important findings are: (1) The training process has negligible influence on the texture of parent phase; (2) The preferred variant of the B19’ phase exhibits tension/compression asymmetry in TWSME; (3) (100) compound twin is the preferred deformation mode for compression TWSME; (4) The mesoscale residual strain field is the dominant factor that induces TWSME; (5) Lattice defects (dislocations) are spatially rearranged after training; (6) Compression TWSME training retards the B2 to B19’ transformation, whilst tension has the opposite effect. The implications of these findings are further discussed.
Klíčová slova
Two-way shape memory effectIn situ synchrotron X-ray diffractionNitinolMicromechanics
Autoři
WANG, Z.; ZHANG, Y.; LIOGAS, K.; CHEN, J.; VUGHAN, G.; KOCICH, R.; KUNČICKÁ, L.; UZUN, F; YOU, Z; KORSUNSKY, A
Vydáno
1. 6. 2023
Nakladatel
ELSEVIER SCIENCE INC
ISSN
0921-5093
Periodikum
Materials Science and Engineering A
Ročník
878
Číslo
145226
Stát
Švýcarská konfederace
Strany počet
12
URL
https://www.sciencedirect.com/science/article/pii/S0921509323006500
BibTex
@article{BUT184111, author="WANG, Z. and ZHANG, Y. and LIOGAS, K. and CHEN, J. and VUGHAN, G. and KOCICH, R. and KUNČICKÁ, L. and UZUN, F and YOU, Z and KORSUNSKY, A", title="In situ synchrotron X-ray diffraction analysis of two-way shape memory effect in Nitinol", journal="Materials Science and Engineering A", year="2023", volume="878", number="145226", pages="12", doi="10.1016/j.msea.2023.145226", issn="0921-5093", url="https://www.sciencedirect.com/science/article/pii/S0921509323006500" }