Detail publikace

ProLEED Studio: software for modeling low-energy electron diffraction patterns

PROCHÁZKA, P. ČECHAL, J.

Originální název

ProLEED Studio: software for modeling low-energy electron diffraction patterns

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

Low-energy electron diffraction patterns contain precise information about the structure of the surface studied. However, retrieving the real space lattice periodicity from complex diffraction patterns is challenging, especially when the modeled patterns originate from superlattices with large unit cells composed of several symmetry-equivalent domains without a simple relation to the substrate. This work presents ProLEED Studio software, built to provide simple, intuitive and precise modeling of low-energy electron diffraction patterns. The interactive graphical user interface allows real-time modeling of experimental diffraction patterns, change of depicted diffraction spot intensities, visualization of different diffraction domains, and manipulation of any lattice points or diffraction spots. The visualization of unit cells, lattice vectors, grids and scale bars as well as the possibility of exporting ready-to-publish models in bitmap and vector formats significantly simplifies the modeling process and publishing of results.

Klíčová slova

low-energy electron diffraction; LEED; ProLEED Studio; reciprocal space; computer programs.

Autoři

PROCHÁZKA, P.; ČECHAL, J.

Vydáno

1. 2. 2024

Nakladatel

INT UNION CRYSTALLOGRAPHY

Místo

CHESTER

ISSN

1600-5767

Periodikum

Journal of Applied Crystallography

Ročník

57

Číslo

1

Stát

Spojené království Velké Británie a Severního Irska

Strany od

187

Strany do

193

Strany počet

7

URL

https://journals.iucr.org/j/issues/2024/01/00/nb5365/index.html

Plný text v Digitální knihovně

http://hdl.handle.net/11012/249390

BibTex

@article{BUT188711,
  author="Pavel {Procházka} and Jan {Čechal}",
  title="ProLEED Studio: software for modeling low-energy electron diffraction patterns",
  journal="Journal of Applied Crystallography",
  year="2024",
  volume="57",
  number="1",
  pages="187--193",
  doi="10.1107/S1600576723010312",
  issn="1600-5767",
  url="https://journals.iucr.org/j/issues/2024/01/00/nb5365/index.html"
}