Detail publikace

Stabilization of semiconductor lasers by fiber Bragg gratings for absolute laser interferometry

MIKEL, B.

Originální název

Stabilization of semiconductor lasers by fiber Bragg gratings for absolute laser interferometry

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

We present application of methods for calculation of parameters of apodized fiber Bragg gratings (FBG). We used combination of methods based on layered dielectric media (LDM) and the transfer matrix. On the contrary to the other calculation techniques the LDM method is based on sequence of thin films of dielectric media assembled in the direction of wave propagation. The combination of the LDM method and the transfer matrix method can be used to the calculation of arbitrary fiber gratings with high precision. For this designed apodized FBG we calculated the phase mask to manufacture by interference patterns. The phase mask and the fixation bottom of the fiber were made by e-beam lithography to achieve highly precise stability during manufacturing. We present the set-up of this system for writing FBG by pulsed UV laser with wavelength 266nm. Measurement of commercially available FBG with comparison to our calculated FBG is presented. We put together the absolute fiber laser interferometer where Vertical Cavity Surface Emitting Laser (VCSEL) is used to easy employment of FBG to stabilization and control the tuning range of the wavelength. The first set-up is presented.

Klíčová slova

Fiber Bragg grating, laser interferometry.

Autoři

MIKEL, B.

Vydáno

1. 1. 2006

Nakladatel

SPIE

Místo

Washington, USA

ISBN

0-8194-6240-3

Kniha

Semiconductor Lasers and Dynamics II

Strany od

61841

Strany do

61848

Strany počet

8

BibTex

@inproceedings{BUT18926,
  author="Břetislav {Mikel} and Radek {Helán} and Ondřej {Číp}",
  title="Stabilization of semiconductor lasers by fiber Bragg gratings for absolute laser interferometry",
  booktitle="Semiconductor Lasers and Dynamics II",
  year="2006",
  pages="8",
  publisher="SPIE",
  address="Washington, USA",
  isbn="0-8194-6240-3"
}