Detail publikace

Data Dependent I Path and their Utilisation in DFT

RŮŽIČKA, R.

Originální název

Data Dependent I Path and their Utilisation in DFT

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

This paper describes an algorithm for utilisation of data paths in the digital circuit, in what functional units occur. These paths, called i paths, are used to transport test patterns and responses to them during the test of the circuit. Some functional units have an identity mode conditioned by the presence of concrete data (e.g. zero for an adder) on their inputs. When these dependencies are taken into account, the cost of modifications for testability of the circuit can be significantly reduced.

Klíčová slova

i path, design-for-testability, i mode, data dependent i mode

Autoři

RŮŽIČKA, R.

Vydáno

1. 1. 2000

Nakladatel

Akademické nakladatelství CERM

Místo

Brno

ISBN

80-7204-155-X

Kniha

Sborník prací studentů a doktorandů FEI VUT

Strany od

228

Strany do

230

Strany počet

3

BibTex

@inproceedings{BUT191625,
  author="Richard {Růžička}",
  title="Data Dependent I Path and their Utilisation in DFT",
  booktitle="Sborník prací studentů a doktorandů FEI VUT",
  year="2000",
  pages="228--230",
  publisher="Akademické nakladatelství CERM",
  address="Brno",
  isbn="80-7204-155-X"
}