Detail publikace

The Unified Approach to Processor Testing

DRÁBEK, V.

Originální název

The Unified Approach to Processor Testing

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The focus is concentrated on different design for testability approaches being used on current processors as full scan, partial scan, standard boundary scan, and so on. An unified approach to processor testing is being proposed, combining several optimised DFT techniques, formal verification and system-level testing.

Autoři

DRÁBEK, V.

Vydáno

1. 1. 1999

Nakladatel

unknown

Místo

Košice-Herlany

ISBN

80-88922-05-4

Kniha

CE&I, Sci. Conf., Košice-Herlany, Slovakia

Strany od

192

Strany do

195

Strany počet

4

BibTex

@inproceedings{BUT192309,
  author="Vladimír {Drábek}",
  title="The Unified Approach to Processor Testing",
  booktitle="CE&I, Sci. Conf., Košice-Herlany, Slovakia",
  year="1999",
  pages="192--195",
  publisher="unknown",
  address="Košice-Herlany",
  isbn="80-88922-05-4"
}