Detail publikace

Low-frequency Noise Measurements used for semiconductors light active devices

VANĚK, J. CHOBOLA, Z.

Originální název

Low-frequency Noise Measurements used for semiconductors light active devices

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Three different sets of semiconductors light active devices were by low frequency noise diagnostic described.

Klíčová slova

Low frequency noise, diagnostic, Silicon, Solar Cells

Autoři

VANĚK, J.; CHOBOLA, Z.

Rok RIV

2005

Vydáno

24. 5. 2005

Místo

Austin, Texas

ISBN

0-8194-5839-2

Kniha

Noise in Devices

Strany od

86

Strany do

93

Strany počet

8

BibTex

@inproceedings{BUT21250,
  author="Jiří {Vaněk} and Zdeněk {Chobola}",
  title="Low-frequency Noise Measurements used for semiconductors light active devices",
  booktitle="Noise in Devices",
  year="2005",
  pages="86--93",
  address="Austin, Texas",
  isbn="0-8194-5839-2"
}