Přístupnostní navigace
E-přihláška
Vyhledávání Vyhledat Zavřít
Detail publikace
SUTORÝ, T. KOLKA, Z. BIOLEK, D. BIOLKOVÁ, V.
Originální název
Nonlinear On-chip Capacitor Characterization
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The paper deals with a modification of the CBCM method for nonlinear on-chip capacitance characterization. The proposed modification uses two DC swept sources to measure the whole nonlinear Q-v characteristic in both polarities without the necessity to switch the measured object. A test-chip implementing the method was designed and manufactured in 0.35um CMOS process. Verification against known capacitances proved the method correctness and accuracy. It was used for MOSCAPs characterization in full operating voltage range.
Klíčová slova
CBCM, testing, MOSCAP
Autoři
SUTORÝ, T.; KOLKA, Z.; BIOLEK, D.; BIOLKOVÁ, V.
Rok RIV
2007
Vydáno
1. 9. 2007
Nakladatel
IEEE
Místo
Sevilla, Spain
ISBN
978-1-4244-1341-6
Kniha
Proceedings of the 18th European Conference on Circuit Theory and Design ECCTD'07
Strany od
220
Strany do
223
Strany počet
4
BibTex
@inproceedings{BUT23792, author="Tomáš {Sutorý} and Zdeněk {Kolka} and Dalibor {Biolek} and Viera {Biolková}", title="Nonlinear On-chip Capacitor Characterization", booktitle="Proceedings of the 18th European Conference on Circuit Theory and Design ECCTD'07", year="2007", pages="220--223", publisher="IEEE", address="Sevilla, Spain", isbn="978-1-4244-1341-6" }