Detail publikace

Solar cell surface local reflaction and pn junction area measurement

ŠKARVADA, P.

Originální název

Solar cell surface local reflaction and pn junction area measurement

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The objective of this paper is focused on study of solar cell parameters by advanced microscopy methods. Scanning Near-field Optical Microscopy (SNOM) is very useful modern tool for sample topography and surface reflectivity measurements. Using this, it is possible to determine pn junction area, localize some structure errors and investigate sample surface with submicron even subwavelength details. Accurate value of pn junction area is important parameter of solar cells, which is used for barrier capacitance calculations and improvement of solar cell effective value.

Klíčová slova

Scanning near-field optical microscopy, solar cell, pn junction area, local reflection

Autoři

ŠKARVADA, P.

Rok RIV

2008

Vydáno

24. 4. 2008

Nakladatel

Ing. Zdeněk Novotný CSc.

Místo

Brno

ISBN

978-80-214-3617-6

Kniha

Proceedings of the 14th conference Student EEICT 2008 volume 4

Číslo edice

1

Strany od

317

Strany do

321

Strany počet

4

BibTex

@inproceedings{BUT26339,
  author="Pavel {Škarvada}",
  title="Solar cell surface local reflaction and pn junction area measurement",
  booktitle="Proceedings of the 14th conference Student EEICT 2008 volume 4",
  year="2008",
  number="1",
  pages="317--321",
  publisher="Ing. Zdeněk Novotný CSc.",
  address="Brno",
  isbn="978-80-214-3617-6"
}