Detail publikace

Study of solar cells I-V chracteristics behaviour in wide range of temperature

MACKŮ, R. KOKTAVÝ, P. ŠKARVADA, P.

Originální název

Study of solar cells I-V chracteristics behaviour in wide range of temperature

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This article is focused on single-crystal silicon solar cells study. The function of solar cell could be affected by many defects e.g. dislocations or impurities in silicon. These defects are often local and can result in lower efficiency or shorter solar cell lifetime. Consequently, we can observe many of defects in electric characteristics of solar cells. Measured IV-characteristics and noise signals provide information for defects classification and/or identification. The results of two basic types of the silicon solar cells measuring at very low temperatures are presented in this paper. Used types of solar cells differ in surface texturing. A cryogenic system with wide range of regulated temperatures is used for this measuring. The microscopic study results of samples surface scanning are also presented.

Klíčová slova

Solar cell, I-V characteristic, recombination, SNOM, noise

Autoři

MACKŮ, R.; KOKTAVÝ, P.; ŠKARVADA, P.

Rok RIV

2008

Vydáno

10. 9. 2008

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

978-80-214-3717-3

Kniha

Electronic Devices and Systems EDS08

Číslo edice

1

Strany od

120

Strany do

125

Strany počet

6

BibTex

@inproceedings{BUT26960,
  author="Robert {Macků} and Pavel {Koktavý} and Pavel {Škarvada}",
  title="Study of solar cells I-V chracteristics behaviour in wide range of temperature",
  booktitle="Electronic Devices and Systems EDS08",
  year="2008",
  number="1",
  pages="120--125",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="978-80-214-3717-3"
}