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ŠKARVADA, P. GRMELA, L. ABUETWIRAT, I. TOMÁNEK, P.
Originální název
Nanooptics of locally induced photocurrent in Si solar cells
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
This paper is intended to present the results of our experimental study of local defect in silicon solar cells. Solar cells defects are evaluated by Near-field optical induced photocurrent, scanning near-field optical microscope characterization and noise spectroscopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of breakdown. All type of noise - thermal, shot, generation, recombination and 1/f type of noise play a different role in reliability analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM, NOBIC and noise spectroscopy represent the coupling of very useful methods to provide a non-destructive characterization on silicon semiconductor solar cells.
Klíčová slova
monocrystalline Si, solar cell, locally induced photocurrent
Autoři
ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P.
Rok RIV
2008
Vydáno
27. 8. 2008
Nakladatel
Zeithamlová Milena, Ing. - Agentura Action M
Místo
Prague
ISBN
978-80-86742-25-0
Kniha
Photonics Prague 2008
Strany od
96
Strany do
97
Strany počet
2
BibTex
@inproceedings{BUT27320, author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}", title="Nanooptics of locally induced photocurrent in Si solar cells", booktitle="Photonics Prague 2008", year="2008", pages="96--97", publisher="Zeithamlová Milena, Ing. - Agentura Action M", address="Prague", isbn="978-80-86742-25-0" }