Detail publikace

Nanooptics of locally induced photocurrent in Si solar cells

ŠKARVADA, P. GRMELA, L. ABUETWIRAT, I. TOMÁNEK, P.

Originální název

Nanooptics of locally induced photocurrent in Si solar cells

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper is intended to present the results of our experimental study of local defect in silicon solar cells. Solar cells defects are evaluated by Near-field optical induced photocurrent, scanning near-field optical microscope characterization and noise spectroscopy. Low frequency noise is a more sensitive tool for analyzing of degradation phenomena, like electro migration and sort of breakdown. All type of noise - thermal, shot, generation, recombination and 1/f type of noise play a different role in reliability analysis. The correlation between noise and transport characteristic indicates possibility of this diagnostic tool. Therefore the SNOM, NOBIC and noise spectroscopy represent the coupling of very useful methods to provide a non-destructive characterization on silicon semiconductor solar cells.

Klíčová slova

monocrystalline Si, solar cell, locally induced photocurrent

Autoři

ŠKARVADA, P.; GRMELA, L.; ABUETWIRAT, I.; TOMÁNEK, P.

Rok RIV

2008

Vydáno

27. 8. 2008

Nakladatel

Zeithamlová Milena, Ing. - Agentura Action M

Místo

Prague

ISBN

978-80-86742-25-0

Kniha

Photonics Prague 2008

Strany od

96

Strany do

97

Strany počet

2

BibTex

@inproceedings{BUT27320,
  author="Pavel {Škarvada} and Lubomír {Grmela} and Inas Faisel {Abuetwirat} and Pavel {Tománek}",
  title="Nanooptics of locally induced photocurrent in Si solar cells",
  booktitle="Photonics Prague 2008",
  year="2008",
  pages="96--97",
  publisher="Zeithamlová Milena, Ing. - Agentura Action M",
  address="Prague",
  isbn="978-80-86742-25-0"
}